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Modeling of SET Seasoning Effects in Phase Change Memory Arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
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MICROELECTRONICS RELIABILITY
Vol. 52, No. 6, pp: 1060-1064, Anno: 2012 |
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Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
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IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 59, No. 3, pp: 813-818, Anno: 2012 |
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A Statistical Model of Erratic Behaviors in Flash Memory Arrays
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
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IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 58, No. 11, pp: 3707-3711, Anno: 2011 |
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Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
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SOLID-STATE ELECTRONICS
Vol. 58, No. 1, pp: 23-27, Anno: 2011 |
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Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off
Zambelli, Cristian; Bertozzi, Davide; Chimenton, Andrea; Olivo, Piero
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IEEE EMBEDDED SYSTEMS LETTERS
Vol. 3, No. 1, pp: 13-15, Anno: 2011 |
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A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
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IEEE ELECTRON DEVICE LETTERS
Vol. 31, No. 6, pp: 612-614, Anno: 2010 |
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A New Analytical Model of the Erasing Operation in Phase Change Memories
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
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IEEE ELECTRON DEVICE LETTERS
Vol. 31, No. 3, pp: 198-200, Anno: 2010 |
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Dielectric reliability for future logic and Non-Volatile Memory applications: a statistical simulation analysis approach
Padovani, Andrea; L., Larcher; Chimenton, Andrea; P., Pavan; Olivo, Piero
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ECS TRANSACTIONS
Vol. 8, No. 1, pp: 237-242, Anno: 2007 |
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Fast Identification of Critical Electrical Disturbs in Nonvolatile Memories
Chimenton, Andrea; Olivo, Piero
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IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667,
IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 54, No. 1, pp: 2438-2444, Anno: 2007 |
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Impact of Pulsed Operation on Performance and Reliability of Flash Memories
Chimenton, Andrea; Irrera, F; Olivo, Piero
dettagli >>
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IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667,
IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 54, No. 1, pp: 1454-1458, Anno: 2007 |
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Improving performance and reliability of NOR-Flash arrays by using pulsed operation
Chimenton, Andrea; F., Irrera; Olivo, Piero
dettagli >>
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ATTUALE:
Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010
PRECEDENTE:
Pergamon Press., Oxford,
MICROELECTRONICS RELIABILITY
Vol. 46, No. 9-11, pp: 1478-1481, Anno: 2006 |
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Impact of High Tunneling Electric Fields on Erasing Instabilities in NOR-Flash Memories
Chimenton, Andrea; Olivo, Piero
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IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 53, No. 1, pp: 97-102, Anno: 2006 |
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Reliability of erasing operation in NOR-Flash memories
Chimenton, Andrea; Olivo, Piero
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MICROELECTRONICS RELIABILITY
Vol. 45, No. 1, pp: 1094-1108, Anno: 2005 |
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Erratic bits in flash memories under Fowler-Nordheim programming
Chimenton, Andrea; Pellati, Paolo; Olivo, Piero
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JAPANESE JOURNAL OF APPLIED PHYSICS. PART 1, REGULAR PAPERS & SHORT NOTES
Vol. 42, No. 1, pp: 2041-2043, Anno: 2003 |
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Flash Memory Reliability: an Improvement Against Erratic Erase Phenomena Using the Constant Charge Erasing Scheme
Chimenton, Andrea; Olivo, Piero
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JAPANESE JOURNAL OF APPLIED PHYSICS. PART 1, REGULAR PAPERS & SHORT NOTES
Vol. 42, No. 1, pp: 2025-2027, Anno: 2003 |
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Erratic Erase in Flash Memories (Part II): Dependence on Operating Conditions
Chimenton, Andrea; Olivo, Piero
dettagli >>
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IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 50, No. 1, pp: 1015-1021, Anno: 2003 |
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Erratic Erase in Flash Memories (part I): Basic Experimental and Statistical Characterization
Chimenton, Andrea; Olivo, Piero
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IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 50, No. 1, pp: 1009-1014, Anno: 2003 |
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Overerase Phenomena: An Insight into Flash memory Reliability
Chimenton, Andrea; Pellati, Paolo; Olivo, Piero
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PROCEEDINGS OF THE IEEE
Vol. 91, No. 1, pp: 617-626, Anno: 2003 |
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Constant charge erasing scheme for Flash Memories
Chimenton, Andrea; Pellati, Paolo; Olivo, Piero
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IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 49, No. 1, pp: 613-618, Anno: 2002 |
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Threshold voltage spread in Flash memories under a constant DQ erasing scheme
Chimenton, Andrea; Pellati, Paolo; Olivo, Piero
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MICROELECTRONIC ENGINEERING
Vol. 59, No. 1, pp: 197-201, Anno: 2001 |
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